Success Story: Overcoming the RFE! NIW Approved for a Mechanical Engineering Expert from China
On March 20th, 2026, we received an EB-2 NIW (National Interest Waiver) I-140 approval for an Expert in the Field of Mechanical Engineering (Approval Notice).
General Field: Mechanical Engineering
Country of Origin: China
State of Residence at the Time of Filing: New York
Approval Notice Date: March 20th, 2026
Processing Time: 4 months and 26 days (Premium Processing Requested)
Case Summary:
Our firm is pleased to share the approval of an EB-2 NIW (National Interest Waiver) petition for a researcher in the field of mechanical engineering specializing in semiconductor packaging reliability and advanced metrology. With over 32,000 successful cases to our name, we are proud that even after receiving an RFE (Request for Evidence), our expert team's thorough preparation and strategic response guided this researcher in the field of mechanical engineering to overcome the RFE and secure a well-deserved approval in just over 4 months.
Client Background and Proposed Endeavor
Holding an M.Eng. in mechanical engineering, this researcher brings deep specialized expertise in electronic packaging reliability testing, semiconductors, and microelectronics. The proposed endeavor is to continue developing innovative metrology and modeling approaches to evaluate the reliability and failure mechanisms of advanced electronic packaging structures, work aimed at enhancing the stability of semiconductor devices, strengthening national manufacturing capabilities, and safeguarding supply chain resilience.
National Significance of the Research
We emphasized that this research carries significant importance and has far-reaching implications for the United States. Failures in semiconductor packaging pose serious threats to device performance and supply chain stability, and by advancing the tools used to detect, model, and prevent such failures, this researcher's work directly supports U.S. manufacturing leadership.
Impressive Credentials and Achievements
To further strengthen the case, we highlighted exceptional credentials:
- Publications: An impressive portfolio of 21 peer-reviewed journal articles (3 of them first-authored), 3 peer-reviewed conference papers (1 of them first-authored), and 3 patents.
- Citations: The published body of work has been cited 134 times.
- Peer Review Service: At least 60 peer reviews have been completed for authoritative journals in the field.
Overcoming the RFE Challenge
The RFE challenged whether the researcher was "well-positioned" to advance the proposed endeavor, citing insufficient evidence of prior achievement and future research projections. Our team responded under the "preponderance of the evidence" standard, submitting a comprehensive body of evidence, from independent citations and high-impact publication metrics to peer review credentials and a concrete research plan, that collectively demonstrated the researcher's proven track record and readiness to continue advancing the field.
Case Outcome
This researcher's pioneering contributions to semiconductor packaging reliability, optical metrology, and AI-enhanced measurement systems position them to make meaningful and lasting contributions to U.S. manufacturing resilience and technological leadership for years to come. We are honored to have supported this journey and extend our sincere best wishes for continued success in both research and career pursuits.